Phase Retrieval and Spectroscopy of Atoms and Molecules in/on Graphene by Advanced Electron Microscopy

The aim of this project is to image and quantify the local atomic and electronic structure and electrostatic fields of functionalized graphene using advanced transmission electron microscopy techniques. This means, determining the position and species of every atom, and mapping the electrostatic potential in the vicinity of the carbon atoms and the functional species in/on graphene, thus enabling a quantitative understanding of the structure and property of each functionalization site separately, and how each of them contributes to the overall properties of the material. Specifically, graphene doped with interstitial atoms and with surface functional species is to be characterised using electron holographic techniques, complemented by analytical electron microscopy techniques.

Our proposed research will deliver a more detailed understanding about the change of the properties of graphene and its structural comprehension by its functionalization. Additionally, our experimental strategy will lead to an integrated characterization methodology in the field of electron microscopy primarily but not exclusively for two-dimensional and radiation sensitive materials.

HRTEM image of graphene (80 kV)

Dr. Gerardo Algara-Siller

AG Strukturforschung / Elektronenmikroskopie

Institut für Physik

Humboldt-Universität zu Berlin

Newtonstraße 15

12489 Berlin, Germany

☎ Phone: +49 (0)30 / 2093 82510